Tuesday, October 11, 2005

5:00 PM - 8:30 PM

Abstract:

The Olympus array technology presented will be shown on the R/D Tech Omniscan for both eddy current and ultrasonic techniques. We will explain the evolution of single channel inspection techniques into array by way of live demonstration. The evolution of single channel techniques, array techniques offer increased inspection speed, more complete traceability, increased probability of detection, and ease of acquisition. Typical examples of data presentations will be shown with an overview of successful commercial applications. Future possibilities are numerous and will also be discussed. Instruments will be available for demonstration and for you to try. BRING YOU TEST SPECIMENS.

About the Speaker:

Mr Sheaffer was with Panametrics (Now Olympus NDT ) for 4 yrs. He has a B.S. in Chemistry from UT Arlington, is LII UT trained, and really enjoy solving NDT applications. He covers North Texas, Oklahoma, and Colorado for Olympus NDT, parent company for R/D Tech, Panametrics NDT, Stavely NDT Technologies, and NDT Engineering. He work closely with aerospace, petrochem, transportation, and service company markets in solving various NDT applications.

Mr. Gries spent several years as an iron worker and this was his segue into NDT via structural inspection for Smith Emery (5 yrs). He has been with R/D Tech for 3 years. He also is UT MT PT LII certified. Gary is the R/D Tech product specialist for the southwest region of the US and specializes in array technologies.